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AFM

Use the zoom capabilities of the SEM to navigate your AFM tip directly to the region of interest. Access information about topography, mechanical, electrical and magnetic properties of the surface with nanometer resolution. Use the AFM tip as a nanomanipulator with force feedback. The AFM is available for Merlin and Crossbeam series (other Zeiss SEM series on inquiry). Already existing systems can be updated by simply exchanging the door.

Features and System specifications:

•SEM guided positioning of AFM tip to area of interest

•Anchored stage technology for ultra high stability and low drift

•In-chamber integration for simultaneous AFM and SEM imaging

•The system is controlled by the C26-Controller of Semilab and the Scan-Software ScanTool™