Semilab\'s optical measurement devices utilize various techniques to precisely extract semiconductor information. Ellipsometer measures film thickness and structure, Photoluminescence provides insights into Bandgap and Carrier concentration, and Reflectometry non-destructively assesses layer properties and thickness. These methods play a crucial role in evaluating material quality and optimizing semiconductor device performance.
Semilab leads in non-destructive electrical measurements, vital for semiconductor understanding. Smart methods reveal device properties safely, uncovering parameters like carrier mobility and resistivity. These techniques drive semiconductor innovation, enabling experts to optimize device performance.
Semilab utilizes direct contact and destructive electrical measurements for comprehensive semiconductor analysis, extracting vital insights into material behavior. Through controlled electrical stimuli, Semilab devices measure key parameters like resistivity, mobility, and doping concentration, essential for optimizing semiconductor performance and advancing technology.
The FPT-series is specialized for flat panel testing, specifically designed for LCD and AMOLED TFT panels up to GEN 8.5. These products integrate multiple measurement probes into a single platform, enabling precise and accurate measurements across the entire flat panel surface. This is facilitated by fast motorization and a high-capacity weight stage.
Semilab collaborates closely with academia to provide customized solutions for semiconductor, photovoltaic, display, and materials science research. Focusing on thin film and surface technologies, our versatile tools meet diverse needs. Through partnerships and shared research, we drive innovation and share findings in conferences and publications.
