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MBIR

The Semilab AMS IR family of products uses proprietary model-based infrared reflectometry to measure thickness, depth and parameters of etched and recess filled trench structures with nanometer precision. It can also measure epitaxial layer thickness with angstrom precision even at 30nm and below.

Features and System specifications:

Product series and sample size:

•IR-2100: Coupon size up to 300 mm

•IR-2200: 150/200 mm, with one open cassette or SMIF loadport

•IR-2500: 300 mm, with one FOUP loadport

•IR-3200: 200/300 mm, with two open cassette, SMIF or FOUP loadports.


Each product is available with one of the following MBIR optics:

•The large spot optics are mainly used for films or for measurements in the device area of patterned wafers.

•The small spot optics enable measurements of scribe line test structures on patterned wafers.

•Cognex Patmax© pattern recognition

•Camera-based autofocus

•Robust glowbar/halogen source with a lifetime > 3 years


Conformity:

•EMC directive

•Low voltage directive

•SEMI standards compliant

•Windows-based software with menu-driven recipe selection/generation