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RT

4 Point Probe (multiple heads) & Non-contact probes (JPV & EDDY) combined in one platform for better operability and long-term stability for wafer makers, device manufacturers and implanter suppliers.

Features and System specifications:

  •Wafer handling: Robot up to 300 mm

  •Inspected area: Full sheet wafers

  •Probes: 4PP (FEOL & BEOL) , EDDY (BEOL) , JPV (FEOL)

  •1-4 permanent 4PP heads for different ranges & applications, Lower CoO

  •Cleanroom class: class 1 minienvironment