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MCV

All Semilab's MCV systems are equipped with automated, full hand-off, mercury handling system to increase safety and reliability. The user friendly software environment controls the measurements and also offers a great flexibility for detailed analysis of the measured structures. Full map capability up to 12"/300 mm. All features listed, including optional ones, are compatible with both the manual MCV-530(L) and the automatic
MCV-2200/2500/3000/3000P systems.

Features and System specifications:

On top of the standard CV measurements and standard electronic units, a number of advanced metrology options are available to extend measurement capabilities:

•Multi-frequency CV meter (1kHz to 10MHz), KEITHLEY-4200 for advanced dielectric layer characterization

•Different capillary diameters to meet application demands: standard capillaries d=1.7mm or capillaries with 0.5, 0.7, 1.0 and 4.0mm optionally

•IV option: Current-Voltage based Dielectric Integrity and Reliability investigations

•Pulsed CV option

•Mercury Vapour Analyzer option