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EIR

Rapid non-contact and non-destructive FTIR 검사 시스템은 웨이퍼 제조 및 IC 제조 업계에서 사용됩니다. Epitaxial Layer 두께, Dielectric 구성 및 High Dopant 농도 측정이 가능합니다.

Features and System specifications:

Complex analysis solutoins:

•Versatile open modelling software - free recipe creation without limitation

•BPSG monitoring in both reflection and transmission mode


Accuracy:

•Smaller spot size leading to lower Edge Exclusion

•Fast X-Y stage

•Model based measurement with improved accuracy and additional parameter monitoring (EPI thickness, TZ, dopant)